high-tech business established with a goal of becoming the world’s premier solution for reliability and noise assessment/analysis.
K-SensorKorea Sensor Lab.



    • - Volunteering Event – Briquette Sharing
      - Scientec Lab Center Sensor Performance Assessment
      - Artronix Inc. Device Assessment
      - Chungnam National Univ. Sensor Performance Assessment
      - SEJU-Engineering Inc. Sensor Performance Assessment
      - LG Display Semiconductor Performance Assessment
      - SK hynix Semiconductor Performance Assessment
      - The spirit of sharing(Scholarship support)
      - National Nanofab Center Infrared Light Element Assessment
      - ETRI Semiconductor Performance Assessment
      - KRISS Semiconductor Performance Assessment
      - KMTL Inc. Defect Shooting Equipment, GPS Performance Assessment
      - Scientec Lab Center Inc. GPS Performance Assessment



    • - Volunteering Event – Briquette Sharing
      - Aero Technology Research Institute, ROKAF Interchange of Technology MOU
      - KIMM Film Element Performance Analysis
      - Chungnam Univ. Gas Sensor Performance Analysis
      - GIST Wafer resistance Analysis
      - ‘National Nanofab Center’ Wafer Element Performance Assessment
      - Auto Industrial Inc. Device Assessment
      - Pyung Hwa Holdings Inc. Sensor Performance Assessment
      - Chemtros PKG Device Assessment
      - ETRI Element Reliability Assessment
      - Hagongyeonchang Inc. Sensor Performance Assessment
      - National Nanofab Center Sensor Performance Assessment
      - KAIST Wafer Assessment
      - Chungnam national Univ. Sensor Performance Assessment
      - Cheongju Univ. Wafer Reliability Assessment
      - Wisecontrol Inc. Sensor Performance Assessment
      - Sirius Inc. Device Assessment
      - IT Convergence Expo Exhibition Participation
      - Kwangwoon Univ. Sensor Performance Assessment
      - Samsung SDI Wafer Reliability Assessment
      - Changwon National Univ. Device Assessment
      - National Nanofab Center Thermal Imagery Sensor Assessment
      - NanoLambda Korea Inc. Nano Spectrometric Sensor Assessment
      - SK hynix Semiconductor Reliability Assessment
      - Dream Material Inc. Gas Sensor Assessment
      - The Spirit of Sharing(Scholarship support)
      - ‘2016 Nano Korea’ Participation
      - E-cap Electronics Inc. Environmental test
      _ Korea Cybernix Inc. Generated Energy Test
      - National Nanofab Center Reliability Assessment
      - Yonsei Univ. Device Assessment
      - CarbonTech Inc. Device Assessment
      - The Korean Sensors Society Test Analysis MOU
      - 2016 Weapon System Test and Evaluation Seminar Paper Presentation
      - MirRNT Inc. Sensor Sensitivity Test
      - Chungnam Univ. Sensor Reliability Assessment
      - ETRI Sensor Environmental Test
      - Sirius Inc. Device Assessment
      - Changwon National Univ. Wafer reliability Assessment
      - KASI(Korea Astronomy and Space Science Institute) Noise Assessment
      - Graphenesquare Inc. Wafer Assessment
      - Sejong Inc. Sensor Reaction rate Assessment
      - Atronix Inc. Wafer Electricity Assessment
      - Chungnam univ. Wafer Reliability Assessment
      - Cellogic Inc. Data Signal Processing Assessment
      - SensorTech Detection limit & Reproductibility Assessment
      - Korea Cybernix Power Efficiency Assessment
      - DTaQ Munition·Exam Analysis Development MOU
      - Cheongju Univ. Reliability Assessment
      - Deryooktech Inc. Wire Assessment
      - ASB Inc. High Frequency Assessment
      - ETRI Sensor Low Frequency Noise Assessment
      - Cheongju Univ. Reliability Assessment
      - SEJU-Engineering Inc. Sensor Sensitivity Assessment
      - 23th Korea Semiconductor Academic Conference Exhibition Participation
      - Sirius Inc. Chip High Temperature Environmental Assessment
      _ MirRNT Inc. Sensor Sensitivity Assessment
      - Scientec Lab Center, Sensor Sensitivity Assessment
      - Selected as a 2016 Voucher Leading Agency
      - The Spirit of Sharing(Briquette sharing volunteer work)
      - SEMICON KOREA/LED KOREA Exhibition Participation
      - Cheongju Univ. Reliability Assessment
      - Wise control Inc. Sensor Sensitivity Assessment
      - Work and Learning Parallel System Participation



    • - Volunteering Event – Briquette Sharing
      - Cooperation Agreement with CNU Technical College
      - Changwon National Univ. Embedded Flash Memory Assessment
      - Atronix Inc. Device Assessment
      - Chungnam National Univ. Low Frequency Noise Assessment
      - ETRI High Frequency Assessment
      - Cheongju Univ. Reliability Assessment
      - NST Inc. Sensor Sensitivity Assessment
      - Attended an Academic Conference of Military Science and Technology
      - ETRI Power Element Reliability Assessment
      - ‘Agency for Defense Development’ Sensor Low Frequency Noise Assessment
      - Inkel Inc. Device Assessment
      - CEO/CTO : Nano Forum Open Forum/R&BD Session Presentation
      - WTA Daejeon Hightech Fair Participation
      - GMEK Inc. Capacitor Element Assessment
      - Corporate Name Change(Korea Sensor Lab)
      - CEO : Military Journal July Issue. Submit Contribution
      - Cheongju Univ. Reliability Assessment
      - ‘2015 Nano Korea’ Participation
      - Selected as a Contact Center Member Company (Techno Park)
      - Academic conference of Military Science and Technology Paper Presentation: The Importance of 1/f noise analysis
      - Scientec Lab Center Co., Ltd. Low Frequency Noise Assessment
      - Hanbat Univ. Device Assessment.
      - Pikosem Inc. High Frequency Assessment
      - Artronix Inc. Device Assessment
      - Micobiomed Inc. Product Low Frequency Noise Assessment
      - Tyco Electronics Inc. Device Assessment
      - Atronix Inc. Device Assessment
      - Changwon National Univ. Embedded Flash Memory Assessment
      - Yonsei Univ. Device Assessment
      - ASB Inc. High Frequency Assessment
      - KAIST Wafer-level Capacitor Assessment
      - GMEK Inc. Device Assessment
      - Micobiomed Inc. Product Low Frequency Noise Assessment
      - Pikosem Inc. High Frequency Assessment
      - GMEK Inc. Element Dielectric Permittivity Assessment
      - Atronix Inc. Device Assessment
      - Nanos Inc. Sensor Low Frequency Noise Assessment
      - The Spirit of Sharing(Scholarship support)
      - Recognized as Enterprise Annex Research Institute(KOITA)
      - Selected as a ETRI IT Private Test Joint Utilization Agency
      - Expansion of KOLAS Accreditation Report Recognition
      - Woosim Inc.-Nanofab Center-Korea Sensor Lab Joint task execution of ‘Ministry of Trade, Industry and Energy’



    • - Participation in Nano Fair 2014 (Dresden, Germany)
      - Changwon National University Embedded Flash Memory Assessment
      - Nanos Consuling for Improvement of Low Frequency Noise
      - Korea University Low Frequency Noise Assessment
      - Accreditation of KOLAS as an Internationally Accredited Test Laboratory
      - Nanos Low Frequency Noise Assessment
      - Samsung Electronics Low Frequency Noise Assessment
      - i3system Pulsed I-V measurement
      - “Grain of Beans” Project (Scholarship Support)



    • - Volunteering Event – Briquette Sharing
      - Volunteering Event – Briquette Sharing - CNU Top 10 Businesses Award
      - Top Employer Commendation from the Mayor of Daejeon
      - Daejeon TechnoPark “Daejeon Software-Tailored Marketing Business” Agreement
      - ISO 9001 Certification, Acquisition of IQNET
      - MagnaChip Device Assessment
      - PICO Semiconductor Device Assessment
      - Women-Owned Business Certificate (Small and Medium Business Administration)
      - DongBu HiTek Device Assessment
      - Discussions for US Branch – SEMATECH(Austin, TX) Visitation
      - Selection as an Endorsed Business by the Technology Institute
        (Daejeon TechnoPark)
      - Changwon National University IP Flash Memory Device Assessment
      - Venture Business Certification (1/15)
      - Technology Relocation in an Agreement with CNU Industry-Academy Cooperation
      - KAIST NanoFab Device Assessment

    • - “Grain of Beans” Project (Scholarship Support, Briquette Sharing)
      - Separation of Corporate Headquarters and Laboratory
      - MagnaChip Reliability and Noise Assessment
      - Peregrine(USA) Device Reliability Assessment