high-tech business established with a goal of becoming the world’s premier solution for reliability and noise assessment/analysis.
Korea Sensor Lab.

  • Internationally Accredited Testing Laboratory.

    Overview of Korea Laboratory Accreditation Scheme (KOLAS)

    • KOLAS is Korea’s accreditation system in place to recognize the technical competence of testing and calibration laboratories
      for those who meet the requirements of international standards of ISO/IEC 17025.
    • Having joined in MRA’s (mutual recognition arrangements) of the relevant international organizations, such as ILAC
      (International Laboratory Accreditation Cooperation) and APLAC (Asia-Pacific Laboratory Accreditation Cooperation),
      KOLAS participates in wide areas of international proficiency testing activities.
    • Being a signatory to the relevant international MRA’s, the testing reports issued by KOLAS accredited laboratories
      are accepted all over the world.

    Benefits of services offered by KOLAS testing laboratories

    • Testing reports issued by KOLAS accredited testing laboratories are accepted to be valid everywhere in the world as it is in line with the WTO’s TBT (Technical Barriers to Trade) Agreement. It allows industries to overcome technical barriers of some advanced countries.
    • The principle of “One Test, Accepted Everywhere” in practice in global markets creates benefits of lower cost and faster flow of goods by avoiding unnecessary duplicate testing in international trade.
    • Testing reliability can be raised by using the internationally recognized testing reports which leads to the improvement of the quality of products and the reduction of cost.
    • Accuracy needs for the improvement of product's performance can be assured.
    • Internationally recognized testing reports can be used as the basis for the legal requirements of health, safety and environmental protection are fulfilled.
    • Internationally recognized testing reports leads to the improvement of enterprise’s image and the easy acquirement of supplier’s competence.

    Accreditation Scheme of KOLAS

    Based on the “Framework Act on National Standards,” KOLAS was established in December 1992 as a governmental accreditation body under the administration of the Korea Agency of Technology and Standards (KATS). KOLAS has ever since made its effort in developing the nation’s laboratory accreditation system that could be in compliance with the international standards. KOLAS takes an important part in international community by becoming a signatory to international MRA’s of APLAC in October 1998 and that of ILAC in November 2000, respectively.

    Fields of KOLAS Accreditation

    Test Item Test Conndition Standard Remark
    Hot Carrier VGS@lsub.max, at least 3 VGS JESD28-A NMOS : DAHC, CHC
    PMOS Hot Carrier VGS@ub.max, at least 3 VGS JESD60A PMOS : DAHC, CHC
    NBTI VGS <0, VDS=VNW=0 JESD90 25°C~175°C
    TDDB Pre-CVS, At least 3 VGS JESD92 25°C~175°C
    Dielectric Integrity Pre-CVS, At least 3 Vstress JEP159 Inter/Intra Metal Dielectric
    Temperature Coefficient of Resistance DC Only 25°C ~ 175°C TTAK.KO-10.0456 Sensor, Resistor
    Flocker Noise Frequency : 1~100 kHz TTAK.KO-10.0457 Sensor
    Transistor Electrical Test -1000V~+1000 V
    MIL-STD-750-3: 2012
    Test Method Standard
    Transistor Electrical
    Test Methods for Semiconductor Devices
    Test Scope
    Part 3: Test Methods 3000 Through 3999
    3001.1 Breakdown Voltage, Collector-to-Base
    3005.1 Burn Out by Pulsing
    3011.2 Breakdown Voltage, Collector-to-Emitter
    3026.1 Breakdown Voltage, Emitter-to-Base
    3051 Safe Operating Area (Continuous DC)
    3401.1 Breakdown Voltage, Gate-to-Source
    3403.1 Gate-to-Source Voltage or Current
    3404 MOSFET Threshold Voltage
    3407.1 Breakdown Voltage, Drain-to-Source
    3411.1 Gate Reverse Current
    3413.1 Drain Current
    3415.1 Drain Reverse Current
    3421.1 Static Drain-to-Source On-State Resistance
    Diode Electrical Test -1000V~+1000 V
    MIL-STD-750-4: 2012
    Test Method Standard
    Diode Electrical Test Methods for Semiconductor Devices Test Scope
    Part 4: Test Methods 4000 Through 4999
    4011.4 Forward Voltage (except 3.2 Pulse method) 4016.4 Reverse Current Leakage
    4021.2 Breakdown Voltage (Diodes)
    4076.1 Saturation Current
    4141.1 Burnout By Repetitive Pulsing

    * JEDEC has been a global leading organization for over 50 years in developing open standards and publications for the microelectronics industry. JEDEC committees provide industry leadership in developing standards for a broad range of technologies.